Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber

Model NO.
55 L
Inside Material
SUS316 Stainless Steel Plate
Standards Complied
IEC-60068-2-66
Device Cooling Method
Natural Cooling or Air Purging Type
Temp. Range
105c~135c(at 100% Relative Humidity)
Outer Dimension
About W900 mm*H1552 mm*D1500 mm
Inner Dimension
Diameter 550 mm*D (Depth) 650mm
Transport Package
by Plywood Case
Specification
Ø 550 mm*D650mm
Trademark
KOMEG
Origin
China
Production Capacity
6000PCS/Year
Reference Price
$ 18,000.00 - 31,500.00
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Product Description

Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber

Product description

The purpose of the Highly Accelerated Aging Test (HAST) is to increase product environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the life test time of the product or system. , The reliability of semiconductor products has improved. At present, most electronic devices can withstand long-term high temperature and high humidity deviation tests without failure. Therefore, the test time used to determine the quality of the finished product has also increased a lot. In the design stage of the product, it is used to quickly expose the defects and weaknesses of the product, and test the sealing and aging performance of its products.

Volume and dimension

Volume About 55 L
Interior size Ø550 mm*D650mm(Drum type pressure inner box)
  Exterior size W 900  mm*H 1552 mm*D 1500  mm(Excluding the protruding part of the machine ! )
Tips: For external dimensions, please confirm the three views according to the final design!

The main technical parameters

 Test Conditions Cool method: :Natural cooling or air purging
Measured at a room temperature of +25 ºC under no load, Measured at normal pressure 101.3Kpa ,  the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5  or IEC60068 -3 ;  the sensor is placed at the air outlet of the air handling unit .
 Temperature range +105ºC~+135ºC (At 100% relative humidity)
Temp.  fluctuation ±0.5ºC
Temp. uniformity ≤±3.0ºC
Temp. deviation ≤±3.0ºC
  Humidity range 1) HUM unsaturated test mode: 65~100%RH
2) STD saturation test mode: 100%RH
  Humidity Fluctuation ±3.0%RH
  Humidity Deviation ±5.0%RH
  Temperature change rate Heat up rate:
 +25ºC ~ +135ºC, full range average speed  approx  45 min ( no-load , no heating )
Load no
  Note : Measured at a room temperature of +25 ºC under no load,the temperature and humidity performance test is measured according to the relevant regulations according to GB/T 2424.5  or IEC60068 -3 ;  the sensor is placed at the air outlet of the air handling unit .
  Pressure range Gauge pressure: +0.2 ~ 200Kpa
*Absolute pressure: 100 ~ 300Kpa
  Pressure deviation ≤±2 kPa
  Pressure rise time Atmospheric pressure to 200Kpa   20min


Product technical features

·Using wet and dry bulb sensor for direct measurement

The control modes are divided into three modes: dry and wet bulb, unsaturated and wet saturated.

·Double-layer cylinder structure, multiple protection functions

The inner tank adopts a circular arc design to prevent condensation and dripping water, which meets the national safety container regulations. Multiple man-machine protections such as various over-pressure and over-temperature, dry-burning leakage and misoperation.

·Slow pressure reduction treatment, optional exhaust and drainage mode

Prevent the sample from being affected by sudden pressure, temperature or water evaporation after the test.

·Automatic water replenishment function, front water level confirmation

At the beginning of the test, the system will automatically add enough water for the test at one time, and the remaining water in the tank can be simply confirmed from the front.

·Komeg independently researched and developed control system, intelligent setting, easy operation

It adopts 7-inch true color touch screen, has 250 groups of 12,500 programs, has USB curve data download function, and RS-485 communication interface.
Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber
Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber Hast Highly Accelerated Aging Test Chamber Semi Conductor Reliability Test Chamber


 

 

Environmental Test Chamber

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